Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Full text!
Format:
e-book
Title:
Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Author:
Li, Xiaowei.; Liu, Cheng; Yan, Guihai
Language:
English
Publisher:
Singapore Springer 2023
ISBN:
981-19-8550-2
981-19-8551-0
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