Machine Learning Support for Fault Diagnosis of System-On-Chip

Full text!
Type:
e-book
Titel:
Machine Learning Support for Fault Diagnosis of System-On-Chip
Auteur:
Girard, Patrick.; Blanton, Shawn; Wang, Li-C
Taal:
Engels
Uitgever:
Cham Springer International Publishing AG 2023
ISBN:
3-031-19638-4
3-031-19639-2
Permalink:
http://bibtest.howest.be/catalog/ebk03:26271278300041