Nanometer Technology Designs High-Quality Delay Tests

Type:

e-book

Titel:

Nanometer Technology Designs High-Quality Delay Tests

Auteur:

Tehranipoor, Mohammad; Ahmed, Nisar

Taal:

Engels

Uitgever:

Springer US 2008

ISBN:

0-387-76486-0
1-4419-4559-8
0-387-75728-7

Permalink:

http://bibtest.howest.be/catalog/ebk03:2670000000010208