Nanometer Technology Designs High-Quality Delay Tests

Format:: e-book
Title:: Nanometer Technology Designs High-Quality Delay Tests
Author:: Tehranipoor, Mohammad; Ahmed, Nisar
Language:: English
Publisher:: Springer US 2008
ISBN:: 0-387-76486-0
1-4419-4559-8
0-387-75728-7
Permalink:: http://bibtest.howest.be/catalog/ebk03:2670000000010208?locale=en