Extreme Statistics in Nanoscale Memory Design - bib.howest.be

Extreme Statistics in Nanoscale Memory Design

Type:: e-book
Titel:: Extreme Statistics in Nanoscale Memory Design
Auteur:: Singhee, Amith; Rutenbar, Rob A.; Rutenbar, Rob A.; Singhee, Amith
Taal:: Engels
Uitgever:: Springer US 2010
ISBN:: 1-4419-6605-6
9786612981838
1-4419-6606-4
1-282-98183-8
Permalink:: http://bibtest.howest.be/catalog/ebk03:2670000000045221