Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Type:: e-book
Titel:: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Auteur:: Walkosz, Weronika
Taal:: Engels
Uitgever:: Springer New York 2011
ISBN:: 1-4419-7816-X
1-4419-7817-8
Permalink:: http://bibtest.howest.be/catalog/ebk03:2670000000082510