Process Variations and Probabilistic Integrated Circuit Design

Type:: e-book
Titel:: Process Variations and Probabilistic Integrated Circuit Design
Auteur:: Dietrich, Manfred; Haase, Joachim
Taal:: Engels
Uitgever:: Springer New York 2012
ISBN:: 1-4419-6620-X
1-4899-8860-2
9786613443854
1-4419-6621-8
1-283-44385-6
Permalink:: http://bibtest.howest.be/catalog/ebk03:2670000000133102