Process Variations and Probabilistic Integrated Circuit Design

Full text!
Format:
e-book
Title:
Process Variations and Probabilistic Integrated Circuit Design
Author:
Dietrich, Manfred; Haase, Joachim
Language:
English
Publisher:
Springer New York 2012
ISBN:
1-4419-6620-X
1-4899-8860-2
9786613443854
1-4419-6621-8
1-283-44385-6
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