Ellipsometry at the Nanoscale - bib.howest.be

Ellipsometry at the Nanoscale

Type:: e-book
Titel:: Ellipsometry at the Nanoscale
Auteur:: Losurdo, Maria; Hingerl, Kurt
Taal:: Engels
Uitgever:: Dordrecht Springer Berlin Heidelberg 2013
ISBN:: 3-642-33955-7
3-642-33956-5
Permalink:: http://bibtest.howest.be/catalog/ebk03:2670000000360432