Progress in VLSI Design and Test

Type:

e-book

Titel:

Progress in VLSI Design and Test

Auteur:

Hutchison, David; Kanade, Takeo; Chattopadhyay, Sanatan; Chattopadhyay, Santanu

Taal:

Engels

Uitgever:

Springer Berlin Heidelberg 2012

ISBN:

3-642-31493-7
3-642-31494-5

Permalink:

http://bibtest.howest.be/catalog/ebk03:3400000000085370