Design, Analysis and Test of Logic Circuits Under Uncertainty - bib.howest.be

Design, Analysis and Test of Logic Circuits Under Uncertainty

Type:: e-book
Titel:: Design, Analysis and Test of Logic Circuits Under Uncertainty
Auteur:: Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.
Taal:: Engels
Uitgever:: Springer Netherlands 2013
ISBN:: 90-481-9643-4
94-007-9798-2
90-481-9644-2
1-283-64077-5
Permalink:: http://bibtest.howest.be/catalog/ebk03:3400000000086400