Stochastic Process Variation in Deep-Submicron CMOS

Full text!
Type:
e-book
Titel:
Stochastic Process Variation in Deep-Submicron CMOS
Auteur:
Zjajo, Amir
Taal:
Engels
Uitgever:
Springer Netherlands 2014
ISBN:
94-007-7780-9
94-007-7781-7
Permalink:
http://bibtest.howest.be/catalog/ebk03:3710000000075852