Debug Automation from Pre-Silicon to Post-Silicon

Full text!
Type:
e-book
Titel:
Debug Automation from Pre-Silicon to Post-Silicon
Auteur:
Dehbashi, Mehdi; Fey, Görschwin
Taal:
Engels
Uitgever:
Springer International Publishing 2015
ISBN:
3-319-09308-8
3-319-09309-6
Permalink:
http://bibtest.howest.be/catalog/ebk03:3710000000249016