Reliability and Failure of Electronic Materials and Devices, 2nd Edition

Full text!
Type:
e-book
Titel:
Reliability and Failure of Electronic Materials and Devices, 2nd Edition
Auteur:
Ohring, Milton; Kasprzak, Lucian
Taal:
Engels
Uitgever:
Academic Press 2011
ISBN:
0-12-088574-3
0-12-810036-2
0-08-057552-8
Permalink:
http://bibtest.howest.be/catalog/ebk03:3710000000260558