Defects and Impurities in Silicon Materials

Full text!
Type:
e-book
Titel:
Defects and Impurities in Silicon Materials
Auteur:
Yoshida; Langouche, Guido
Taal:
Engels
Uitgever:
Springer Japan 2015
ISBN:
4-431-55799-7
4-431-55800-4
Permalink:
http://bibtest.howest.be/catalog/ebk03:3710000000627611