Ferroelectric-Gate Field Effect Transistor Memories

Type:

e-book

Titel:

Ferroelectric-Gate Field Effect Transistor Memories

Auteur:

Park, Byung-Eun; Ishiwara, Hiroshi; Okuyama, Masanori; Sakai, Shigeki; Yoon, Sung-Min; Ishiwara, Hiroshi; Okuyama, Masanori; Sakai, Shigeki; Yoon, Sung-Min

Taal:

Engels

Uitgever:

Dordrecht Springer Netherlands 2016

ISBN:

94-024-0839-8
94-024-0841-X

Permalink:

http://bibtest.howest.be/catalog/ebk03:3710000000847059