Testing of Interposer-Based 2.5D Integrated Circuits

Type:

e-book

Titel:

Testing of Interposer-Based 2.5D Integrated Circuits

Auteur:

Wang, Ran; Chakrabarty, Krishnendu; Chakrabarty, Krishnendu

Taal:

Engels

Uitgever:

Springer International Publishing 2017

ISBN:

3-319-54713-5
3-319-54714-3

Permalink:

http://bibtest.howest.be/catalog/ebk03:3710000001118046