Testing of Interposer-Based 2.5D Integrated Circuits - bib.howest.be

Testing of Interposer-Based 2.5D Integrated Circuits

Format:: e-book
Title:: Testing of Interposer-Based 2.5D Integrated Circuits
Author:: Wang, Ran; Chakrabarty, Krishnendu; Chakrabarty, Krishnendu
Language:: English
Publisher:: Springer International Publishing 2017
ISBN:: 3-319-54713-5
3-319-54714-3
Permalink:: http://bibtest.howest.be/catalog/ebk03:3710000001118046?locale=en