Pattern Analysis and Machine Intelligence: First International Conference, ICPAMI 2024, Shanghai, China, August 30 – September 1, 2024, Proceedings

Full text!
Type:
e-book
Titel:
Pattern Analysis and Machine Intelligence: First International Conference, ICPAMI 2024, Shanghai, China, August 30 – September 1, 2024, Proceedings
Auteur:
Jie Yang
Taal:
Engels
Uitgever:
Springer Nature 2025
ISBN:
981-9633-48-6
981-9633-49-4
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http://bibtest.howest.be/catalog/ebk03:38111501400041