Fundamentals of Electromigration-Aware Integrated Circuit Design

Full text!
Format:
e-book
Title:
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author:
Lienig, Jens; Thiele, Matthias
Language:
English
Publisher:
Springer International Publishing 2018
ISBN:
3-319-73557-8
3-319-73558-6
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