Test Generation of Crosstalk Delay Faults in VLSI Circuits - bib.howest.be

Test Generation of Crosstalk Delay Faults in VLSI Circuits

Type:: e-book
Titel:: Test Generation of Crosstalk Delay Faults in VLSI Circuits
Auteur:: Jayanthy; Bhuvaneswari, M. C.
Taal:: Engels
Uitgever:: Springer Singapore 2019
ISBN:: 981-13-2492-1
981-13-2493-X
Permalink:: http://bibtest.howest.be/catalog/ebk03:4100000006675060