Long-Term Reliability of Nanometer VLSI Systems

Full text!
Type:
e-book
Titel:
Long-Term Reliability of Nanometer VLSI Systems
Auteur:
Tan; Kiamehr, Saman; Kim, Taeyoung; Sun, Zeyu; Tahoori, Mehdi; Wang, Shengcheng
Taal:
Engels
Uitgever:
Springer International Publishing 2019
ISBN:
3-030-26171-9
3-030-26172-7
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http://bibtest.howest.be/catalog/ebk03:4100000009273643