Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

Type:

e-book

Titel:

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

Auteur:

Canelas, António Manuel Lourenço; Guilherme, Jorge Manuel Correia; Horta, Nuno Cavaco Gomes

Taal:

Engels

Uitgever:

Springer International Publishing 2020

ISBN:

3-030-41535-X
3-030-41536-8

Permalink:

http://bibtest.howest.be/catalog/ebk03:4100000010673419