Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

Format:

e-book

Title:

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

Author:

Canelas, António Manuel Lourenço; Guilherme, Jorge Manuel Correia; Horta, Nuno Cavaco Gomes

Language:

English

Publisher:

Springer International Publishing 2020

ISBN:

3-030-41535-X
3-030-41536-8

Permalink:

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