Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications

Full text!
Type:
e-book
Titel:
Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications
Auteur:
Park; Ishiwara, Hiroshi; Ishiwara, Hiroshi; Okuyama, Masanori; Okuyama, Masanori; Sakai, Shigeki; Sakai, Shigeki; Yoon, Sung-Min; Yoon, Sung-Min
Taal:
Engels
Uitgever:
Springer Singapore 2020
ISBN:
981-15-1211-6
981-15-1212-4
Permalink:
http://bibtest.howest.be/catalog/ebk03:4100000010770719