Scanning Electron Microscopy and X-Ray Microanalysis

Format:: e-book
Title:: Scanning Electron Microscopy and X-Ray Microanalysis
Author:: Goldstein; Joy, David C.; Joy, David C.; Michael, Joseph R.; Michael, Joseph R.; Newbury, Dale E.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Scott, John Henry J.
Language:: English
Publisher:: Springer New York 2018
ISBN:: 1-4939-6674-X
1-4939-6676-6
Permalink:: http://bibtest.howest.be/catalog/ebk03:4340000000223146?locale=en