Data-driven Methods for Fault Localization in Process Technology

Full text!
Format:
e-book
Title:
Data-driven Methods for Fault Localization in Process Technology
Author:
Kühnert, Christian
Language:
English
Publisher:
KIT Scientific Publishing
ISBN:
3-7315-0098-1
1000036427
Permalink:
http://bibtest.howest.be/catalog/ebk03:4920000000101914?locale=en