Technology Assessment in a Globalized World

Type:

e-book

Titel:

Technology Assessment in a Globalized World

Auteur:

Hennen, Leonhard; Hahn, Julia; Ladikas, Miltos; Lindner, Ralf; Peissl, Walter; van Est, Rinie

Taal:

Engels

Uitgever:

Springer International Publishing 2023

ISBN:

3-031-10616-4
3-031-10617-2

Permalink:

http://bibtest.howest.be/catalog/ebk03:5720000000120048