Technology Assessment in a Globalized World

Format:

e-book

Title:

Technology Assessment in a Globalized World

Author:

Hennen, Leonhard; Hahn, Julia; Ladikas, Miltos; Lindner, Ralf; Peissl, Walter; van Est, Rinie

Language:

English

Publisher:

Springer International Publishing 2023

ISBN:

3-031-10616-4
3-031-10617-2

Permalink:

http://bibtest.howest.be/catalog/ebk03:5720000000120048?locale=en