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1. Helium Ion Microscopy
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Author:
Joy, David C.; Joy
Publisher:
Springer New York 2013
Format:
e-book
2. Scanning Electron Microscopy and X-Ray Microanalysis
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Author:
Goldstein; Joy, David C.; Joy, David C.; Michael, Joseph R.; Michael, Joseph R.; Newbury, Dale E.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Scott, John Henry J.
Publisher:
Springer New York 2018
Format:
e-book