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1. Electromigration Modeling at Circuit Layout Level
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Auteur:
Tan, Cher Ming; Tan; He, Feifei
Uitgever:
Springer Singapore 2013
Type:
e-book
2. Theory and Practice of Quality and Reliability Engineering in Asia Industry
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Auteur:
Tan, Cher Ming; Goh, Thong Ngee; Goh, Thong Ngee
Uitgever:
Springer Singapore 2017
Type:
e-book
3. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
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Auteur:
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou; Li, Wei; Tan, Cher Ming; Gan, Zhenghao; Hou, Yuejin
Uitgever:
Springer London 2011
Type:
e-book
4. Future Learning in Primary Schools
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Auteur:
Chai, Ching Sing; Lim, Cher Ping; Tan, Chun Ming
Uitgever:
Springer Singapore 2016
Type:
e-book