Microelectronic Test Structures for CMOS Technology

Type:: e-book
Titel:: Microelectronic Test Structures for CMOS Technology
Auteur:: Bhushan, Manjul; Ketchen, Mark B.
Taal:: Engels
Uitgever:: Springer New York 2011
ISBN:: 1-4419-9376-2
1-4899-9055-0
9786613351036
1-283-35103-X
1-4419-9377-0
Permalink:: http://bibtest.howest.be/catalog/ebk03:2550000000045894