New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

Type:: e-book
Titel:: New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
Auteur:: Zalevsky, Zeev; Gur, Eran; Livshits, Pavel
Taal:: Engels
Uitgever:: William Andrew Publishing 2014
ISBN:: 0-323-24143-3
1-306-16789-2
0-12-800017-1
Permalink:: http://bibtest.howest.be/catalog/ebk03:2550000001166671