Design, Analysis and Test of Logic Circuits Under Uncertainty

Format:: e-book
Title:: Design, Analysis and Test of Logic Circuits Under Uncertainty
Author:: Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.
Language:: English
Publisher:: Springer Netherlands 2013
ISBN:: 90-481-9643-4
94-007-9798-2
90-481-9644-2
1-283-64077-5
Permalink:: http://bibtest.howest.be/catalog/ebk03:3400000000086400?locale=en