Fundamentals of Electromigration-Aware Integrated Circuit Design

Type:

e-book

Titel:

Fundamentals of Electromigration-Aware Integrated Circuit Design

Auteur:

Lienig, Jens.; Rothe, Susann; Thiele, Matthias

Taal:

Engels

Uitgever:

Cham Springer 2025

ISBN:

3-031-80022-2
3-031-80023-0

Permalink:

http://bibtest.howest.be/catalog/ebk03:37723117200041