Surface analysis : the principal techniques
- Type:
- boek
- Titel:
- Surface analysis : the principal techniques
- Jaar:
- 2006
- Taal:
- Engels
- Uitgever:
- Chichester : Wiley, 2006
- Paginering:
- XVI, 457 p. : ill.
- Plaatsnummer:
- PENTA.640.4 VICK 06 (PENTA)
- ISBN:
- 0471972924
- Onderwerp:
- Grensvlakchemie
Materiaalonderzoek
Meettechnieken
Oppervlakte-analyse - Samenvatting:
- Vacuum Technology for Applied Surface Science (R Wilson) Electron Spectroscopy for Chemical Analysis (B Ratner & D Castner) Auger Electron Spectroscopy (H Mathieu) Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry (J Vickerman & A Swift) Low-Energy Ion Scattering and Rutherford Backscattering (E Taglauer) Vibrational Spectroscopy from Surfaces (M Pemble) Surface Structure Determination by Interference Techniques (W Flavell) Scanning Tunnelling Microscopy and Atomic Force Microscopy (G Leggett) Index.
- Permalink:
- http://bibtest.howest.be/catalog/hws01:001927387
