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2015
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1.
Fault Diagnosis and Fault-Tolerant Control and Guidance for Aerospace Vehicles
Full text!
Author:
Zolghadri, Ali; Zolghadri; Henry, David; Cieslak, Jérôme; Efimov, Denis; Goupil, Philippe
Publisher:
Springer London 2014
Format:
e-book
2.
Micro-, Meso- and Macro-Connectomics of the Brain
Full text!
Author:
Henry Kennedy, David C. Van Essen, Yves Christen; Christen, Yves; Kennedy, Henry; Van Essen, David C.
Publisher:
Springer International Publishing 2016
Format:
e-book
3.
Trend-Driven Innovation : beat Accelerating Customer Expectations
Author:
Luthy, Maxwell; Mason, Henry; Mattin, David
Publisher:
New Jersey : John Wiley & Sons, 2015
Year:
2015
Format:
book
4.
Cyber Security Awareness for CEOs and Management
Full text!
Author:
Willson, David; Dalziel, Henry
Publisher:
Syngress 2016
Format:
e-book
5.
Learn GameSalad for iOS: Game Development for iPhone, iPad, and HTML5
Full text!
Author:
Guerineau, David; Abrams, Henry
Publisher:
Apress 2012
Format:
e-book
6.
The Basics of Hacking and Penetration Testing : Ethical Hacking and Penetration Testing Made Easy
Full text!
Author:
Engebretson, Patrick Henry; Kennedy, David
Publisher:
Syngress 2013
Format:
e-book
7.
Network Reliability in Practice
Full text!
Author:
Levinson, David M.; Liu, Henry X.; Bell, Michael
Publisher:
Springer New York 2012
Format:
e-book
8.
Essentials of Blood Product Management in Anesthesia Practice
Full text!
Author:
Corey S. Scher; Kaye, Alan David; Leavitt, Sarah; Liu, Henry; Perelman, Seth
Publisher:
Springer International Publishing 2021
Format:
e-book
9.
Scanning Electron Microscopy and X-Ray Microanalysis
Full text!
Author:
Goldstein; Joy, David C.; Joy, David C.; Michael, Joseph R.; Michael, Joseph R.; Newbury, Dale E.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Ritchie, Nicholas W. M.; Scott, John Henry J.; Scott, John Henry J.
Publisher:
Springer New York 2018
Format:
e-book
10.
Computational and Analytical Mathematics
Full text!
Author:
Bailey, David H.; Bauschke, Heinz H.; Borwein, Peter; Garvan, Frank; Théra, Michel; Vanderwerff, Jon D.; Wolkowicz, Henry
Publisher:
Springer New York 2013
Format:
e-book
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